DocumentCode :
1222873
Title :
Anode Sheath Growth and Collapse in a Hollow-Anode Vacuum Arc
Author :
Dollinger, R. ; Dettman, D.R. ; Lee, J.L. ; Gilmour, A.S., Jr. ; Malone, D.P. ; Schwartz, P.R.
Volume :
8
Issue :
4
fYear :
1980
Firstpage :
302
Lastpage :
307
Abstract :
Experimental diagnostics in a hollow-anode vacuum arc device have shown that the repetitive growth and collapse of an anode sheath is responsible for observed tens-of-kV voltage spikes. A dynamic model of device operation based on circuit effects and a time varying quasi-Child-Langmuir sheath is presented. The scaling of the repetition rate with respect to cathode material is discussed. The device is being investigated for use as a current limiter for ~10-MW pulses.
Keywords :
Anodes; Capacitors; Cathodes; Circuits; Current density; Interrupters; Pulse power systems; Vacuum arcs; Vacuum systems; Voltage;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.1980.4317331
Filename :
4317331
Link To Document :
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