DocumentCode :
1223076
Title :
A variable temperature cryostat that produces in situ clean-up of germanium. detector surfaces
Author :
Pehl, R.H. ; Madden, N.W. ; Malone, D.F. ; Cork, C.P. ; Landis, D.A. ; Xing, J.S. ; Friesel, D.L.
Author_Institution :
Lawrence Berkeley Lab., CA, USA
Volume :
36
Issue :
1
fYear :
1989
fDate :
2/1/1989 12:00:00 AM
Firstpage :
190
Lastpage :
193
Abstract :
Variable-temperature cryostats that can maintain germanium detectors at temperatures from 82 K to about 400 K while the thermal shield surrounding the detectors remains much colder have been developed. Cryostats such as these offer the possibility of cryopumping material from the surface of detectors to the colder thermal shield. The diode characteristics of several detectors have shown very significant improvement following thermal cycles up to about 150 K in these cryostats. The possible applications of such cryostats are discussed
Keywords :
cryostats; elemental semiconductors; germanium; semiconductor counters; 82 to 400 K; Ge detectors; cryopumping; diode characteristics; in situ clean-up; semiconductor detectors; thermal shield; variable temperature cryostat; Cyclotrons; Diodes; Fingers; Germanium; Heating; Impedance; Infrared detectors; Nitrogen; Radiation detectors; Temperature distribution;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.34432
Filename :
34432
Link To Document :
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