• DocumentCode
    1223076
  • Title

    A variable temperature cryostat that produces in situ clean-up of germanium. detector surfaces

  • Author

    Pehl, R.H. ; Madden, N.W. ; Malone, D.F. ; Cork, C.P. ; Landis, D.A. ; Xing, J.S. ; Friesel, D.L.

  • Author_Institution
    Lawrence Berkeley Lab., CA, USA
  • Volume
    36
  • Issue
    1
  • fYear
    1989
  • fDate
    2/1/1989 12:00:00 AM
  • Firstpage
    190
  • Lastpage
    193
  • Abstract
    Variable-temperature cryostats that can maintain germanium detectors at temperatures from 82 K to about 400 K while the thermal shield surrounding the detectors remains much colder have been developed. Cryostats such as these offer the possibility of cryopumping material from the surface of detectors to the colder thermal shield. The diode characteristics of several detectors have shown very significant improvement following thermal cycles up to about 150 K in these cryostats. The possible applications of such cryostats are discussed
  • Keywords
    cryostats; elemental semiconductors; germanium; semiconductor counters; 82 to 400 K; Ge detectors; cryopumping; diode characteristics; in situ clean-up; semiconductor detectors; thermal shield; variable temperature cryostat; Cyclotrons; Diodes; Fingers; Germanium; Heating; Impedance; Infrared detectors; Nitrogen; Radiation detectors; Temperature distribution;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.34432
  • Filename
    34432