DocumentCode
1223110
Title
Spiral silicon drift detectors
Author
Rehak, P. ; Gatti, E. ; Longoni, A. ; Sampietro, M. ; Holl, P. ; Lutz, G. ; Kemmer, J. ; Prechtel, U. ; Ziemann, T.
Author_Institution
Brookhaven Nat. Lab., Upton, NY, USA
Volume
36
Issue
1
fYear
1989
fDate
2/1/1989 12:00:00 AM
Firstpage
203
Lastpage
209
Abstract
An advanced large-area silicon photodiode and X-ray detector, called the spiral drift detector, was designed, produced, and tested. The detector has a very small capacitance of about 0.1 pF and a leakage current under 1 nA at room temperature. All electrons generated at the silicon-silicon oxide interface are collected on a guard rather than contributing to the detector leakage current. The decrease of the leakage current reduces the parallel noise of the detector. This decrease and the very small capacitance of the detector anode with a capacitively matched preamplifier may improve the energy resolution of spiral drift detectors operating at room temperature to about 50 electrons RMS. This resolution is in the range attainable at present only by cooled semiconductor detectors
Keywords
X-ray detection and measurement; elemental semiconductors; photodiodes; semiconductor counters; silicon; 0.1 pF; 1 nA; Si-SiO2; X-ray detector; capacitively matched preamplifier; energy resolution; large area Si photodetector; leakage current; parallel noise; semiconductor counter; spiral drift detector; Capacitance; Electrons; Energy resolution; Leak detection; Leakage current; Photodiodes; Silicon; Spirals; Temperature; X-ray detectors;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.34435
Filename
34435
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