• DocumentCode
    1223110
  • Title

    Spiral silicon drift detectors

  • Author

    Rehak, P. ; Gatti, E. ; Longoni, A. ; Sampietro, M. ; Holl, P. ; Lutz, G. ; Kemmer, J. ; Prechtel, U. ; Ziemann, T.

  • Author_Institution
    Brookhaven Nat. Lab., Upton, NY, USA
  • Volume
    36
  • Issue
    1
  • fYear
    1989
  • fDate
    2/1/1989 12:00:00 AM
  • Firstpage
    203
  • Lastpage
    209
  • Abstract
    An advanced large-area silicon photodiode and X-ray detector, called the spiral drift detector, was designed, produced, and tested. The detector has a very small capacitance of about 0.1 pF and a leakage current under 1 nA at room temperature. All electrons generated at the silicon-silicon oxide interface are collected on a guard rather than contributing to the detector leakage current. The decrease of the leakage current reduces the parallel noise of the detector. This decrease and the very small capacitance of the detector anode with a capacitively matched preamplifier may improve the energy resolution of spiral drift detectors operating at room temperature to about 50 electrons RMS. This resolution is in the range attainable at present only by cooled semiconductor detectors
  • Keywords
    X-ray detection and measurement; elemental semiconductors; photodiodes; semiconductor counters; silicon; 0.1 pF; 1 nA; Si-SiO2; X-ray detector; capacitively matched preamplifier; energy resolution; large area Si photodetector; leakage current; parallel noise; semiconductor counter; spiral drift detector; Capacitance; Electrons; Energy resolution; Leak detection; Leakage current; Photodiodes; Silicon; Spirals; Temperature; X-ray detectors;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.34435
  • Filename
    34435