Simulation and measurement of supply and substrate noise in mixed-signal ICs

Author

Owens, Brian E. ; Adluri, Sirisha ; Birrer, Patrick ; Shreeve, Robert ; Arunachalam, Sasi Kumar ; Mayaram, Kartikeya ; Fiez, Terri S.

Author_Institution

Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR, USA

Volume

40

Issue

2

fYear

2005

Firstpage

382

Lastpage

391

Abstract

Digital noise in mixed-signal circuits is characterized using a scalable macromodel for substrate noise coupling. The noise coupling obtained through simulations is verified with measured data from a digital noise generator and noise sensitive analog circuits fabricated in the 0.35-μm heavily doped CMOS process. The simulations and measurements also demonstrate the effectiveness of including grounded guard rings and separating bulk and supply pins in digital circuits to reduce substrate coupling.

Keywords

CMOS analogue integrated circuits; CMOS digital integrated circuits; circuit simulation; integrated circuit noise; mixed analogue-digital integrated circuits; noise measurement; substrates; 0.35 micron; coupling noise; digital noise generator; integrated circuit noise; mixed-signal IC; mixed-signal circuit; mixed-signal noise; noise measurement; noise sensitive analog circuit; substrate noise coupling; supply noise; Circuit noise; Circuit simulation; Computational modeling; Coupling circuits; Integrated circuit measurements; Integrated circuit noise; Noise generators; Noise level; Noise measurement; Packaging;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/JSSC.2004.841039

Filename

1388627