DocumentCode :
1223450
Title :
A CMOS smart temperature sensor with a 3σ inaccuracy of ±0.5°C from -50°C to 120°C
Author :
Pertijs, Michiel A P ; Niederkorn, Andrea ; Ma, Xu ; McKillop, Bill ; Bakker, Anton ; Huijsing, Johan H.
Author_Institution :
Electron. Instrum. Lab., Delft Univ. of Technol., Netherlands
Volume :
40
Issue :
2
fYear :
2005
Firstpage :
454
Lastpage :
461
Abstract :
A low-cost temperature sensor with on-chip sigma-delta ADC and digital bus interface was realized in a 0.5 μm CMOS process. Substrate PNP transistors are used for temperature sensing and for generating the ADC´s reference voltage. To obtain a high initial accuracy in the readout circuitry, chopper amplifiers and dynamic element matching are used. High linearity is obtained by using second-order curvature correction. With these measures, the sensor´s temperature error is dominated by spread on the base-emitter voltage of the PNP transistors. This is trimmed after packaging by comparing the sensor´s output with the die temperature measured using an extra on-chip calibration transistor. Compared to traditional calibration techniques, this procedure is much faster and therefore reduces production costs. The sensor is accurate to within ±0.5°C (3σ) from -50°C to 120°C.
Keywords :
CMOS integrated circuits; amplifiers; calibration; intelligent sensors; readout electronics; sigma-delta modulation; temperature sensors; 0.5 micron; ADC reference voltage; CMOS smart temperature sensor; base-emitter voltage; chopper amplifiers; digital bus interface; dynamic element matching; dynamic offset cancellation; low-cost temperature sensor; on-chip calibration transistor; on-chip sigma-delta ADC; pnp transistors; production costs; readout circuitry; second-order curvature correction; sensor temperature error; temperature sensing; CMOS process; Calibration; Choppers; Circuits; Delta-sigma modulation; Linearity; Packaging; Temperature measurement; Temperature sensors; Voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2004.841013
Filename :
1388634
Link To Document :
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