DocumentCode :
1223468
Title :
Statistical Methods in the Design and Development of Electronic Systems
Author :
Schwartz, L.S.
Author_Institution :
Hazeltine Electronics Corporation, Little Neck, L. I., N.Y.
Volume :
36
Issue :
5
fYear :
1948
fDate :
5/1/1948 12:00:00 AM
Firstpage :
664
Lastpage :
670
Abstract :
A study is made of certain factors affecting tolerance assignment in the production and operational stages of an electronic system. The procedure adopted is first to review very briefly some of the fundamentals of the statistical control of quality and the assignment of valid, economical production tolerances, and second to describe how the principles may be applied in the setting of some operational tolerances for an electronic system. The advantages to design and development derived from a knowledge of how tolerances, both productional and operational, are assigned, and how they combine statistically, are discussed.
Keywords :
Bandwidth; Control systems; Design methodology; Frequency; Measurement standards; Production systems; Senior members; Statistical analysis; Statistics; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IRE
Publisher :
ieee
ISSN :
0096-8390
Type :
jour
DOI :
10.1109/JRPROC.1948.229960
Filename :
1697708
Link To Document :
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