• DocumentCode
    1223468
  • Title

    Statistical Methods in the Design and Development of Electronic Systems

  • Author

    Schwartz, L.S.

  • Author_Institution
    Hazeltine Electronics Corporation, Little Neck, L. I., N.Y.
  • Volume
    36
  • Issue
    5
  • fYear
    1948
  • fDate
    5/1/1948 12:00:00 AM
  • Firstpage
    664
  • Lastpage
    670
  • Abstract
    A study is made of certain factors affecting tolerance assignment in the production and operational stages of an electronic system. The procedure adopted is first to review very briefly some of the fundamentals of the statistical control of quality and the assignment of valid, economical production tolerances, and second to describe how the principles may be applied in the setting of some operational tolerances for an electronic system. The advantages to design and development derived from a knowledge of how tolerances, both productional and operational, are assigned, and how they combine statistically, are discussed.
  • Keywords
    Bandwidth; Control systems; Design methodology; Frequency; Measurement standards; Production systems; Senior members; Statistical analysis; Statistics; Voltage;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IRE
  • Publisher
    ieee
  • ISSN
    0096-8390
  • Type

    jour

  • DOI
    10.1109/JRPROC.1948.229960
  • Filename
    1697708