Title :
A fast low-power time-to-voltage converter for high luminosity collider detectors
Author :
Stevens, A.E. ; Budihartono, V. ; Van Berg, R.P. ; Van der Spiegel, J. ; Williams, H.H. ; Callewaert, L. ; Eyckmans, W. ; Sansen, W.
Author_Institution :
AT&T Bell Lab., Whippany, NJ, USA
fDate :
2/1/1989 12:00:00 AM
Abstract :
A novel CMOS (complementary metal oxide semiconductor) integrated circuit has been designed to measure the time interval between two digital voltage pulses. The measurement is stored as an analog voltage on a capacitor for later digitization. The targeted range of measurable times is 5-25 ns, with a resolution of 0.5 ns. An additional feature of the circuit is a storage depth of eight samples, i.e. eight consecutive time measurements can be recorded individually. Hence, the chip is a combination of a time-to-voltage converter and an analog memory
Keywords :
CMOS integrated circuits; convertors; linear integrated circuits; nuclear electronics; time measurement; 5 to 25 ns; CMOS; analog memory; analog voltage; capacitor; complementary metal oxide semiconductor; digital voltage pulses; integrated circuit; storage depth; time-to-voltage converter; Analog memory; CMOS digital integrated circuits; CMOS integrated circuits; Capacitors; Integrated circuit measurements; Pulse circuits; Pulse measurements; Semiconductor device measurement; Time measurement; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
