DocumentCode
1223788
Title
The effect of surge testing on the voltage endurance life of stator coils
Author
Dymond, James H. ; Stranges, Meredith K W ; Stranges, Nick
Author_Institution
Gen. Electr. Canada, Peterborough, Ont., Canada
Volume
41
Issue
1
fYear
2005
Firstpage
120
Lastpage
126
Abstract
Surge tests with short rise times are used to ensure turn insulation integrity in form-wound vacuum-pressure impregnated (VPI) coils prior to resin treatment. Use of this test migrated from the evaluation of fully processed generator bars and random wound stators. The dielectric properties of the insulation in these systems are fully developed at the time of testing. This is not true of "green" (unimpregnated) VPI coils. Although surge testing is a valuable manufacturing quality test, an excessive transient electric field in uncured coils may cause irreversible changes to the insulation. These changes may affect the life of the insulation system after complete impregnation and cure. This paper describes laboratory tests and finite element simulations that examine the effect of applied surge test voltage and number of applied pulses on voltage endurance (VE) life. The sympathetic voltage response in a single coil as a function of its location within a winding is described for a stator undergoing green surge testing as part of a quality assurance program. Results of VE testing and sample dissection data are presented. Test voltage was identified a more significant factor on VE life than the number of pulses applied.
Keywords
coils; dielectric properties; electric fields; finite element analysis; insulation testing; stators; surges; dielectric property; finite element analysis; form-wound vacuum-pressure impregnated coil; generator bar; random wound stator; resin treatment; stator coil; surge testing; transient electric field; voltage endurance life; Bars; Coils; Dielectrics and electrical insulation; Insulation testing; Life testing; Resins; Stators; Surges; Voltage; Wounds;
fLanguage
English
Journal_Title
Industry Applications, IEEE Transactions on
Publisher
ieee
ISSN
0093-9994
Type
jour
DOI
10.1109/TIA.2004.841018
Filename
1388669
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