DocumentCode :
1224299
Title :
Effect of V2O5 on the sintering behavior, microstructure, and electrical properties of (Na0.5K0.5)NbO3 ceramics
Author :
Pan, Hongyan ; Jin, Dengren ; Wu, Wenbiao ; Cheng, Jinrong ; Meng, Zhongyan
Author_Institution :
Dept. of Electron. Inf. Mater., Shanghai Univ., Shanghai
Volume :
55
Issue :
5
fYear :
2008
fDate :
5/1/2008 12:00:00 AM
Firstpage :
994
Lastpage :
999
Abstract :
Well-sintered (Na0.5K0.5)NbO3-x mol% V2O5 ceramics (abbreviated as NKN-V) with fine electrical properties were successfully prepared by conventional solid-state reaction through the careful control of processing conditions. The sintering behavior, phase structure, and electrical properties of the V2O5-doped NKN ceramics were investigated. Results show that when the V2O5 content is 0.6 mol%, the NKN ceramics attained the maximum density of 4.46 g/cm3 (about 98.9% of the theoretical density) at 1060degC, and therefore possessed enhanced electrical properties. But when the V2O5 content continued increasing, the density decreased. The secondary phase (Na2V6O16) could be detected by XRD analysis in all samples except x = 0 mol%. The Curie temperature of the NKN-based materials was found to decrease with the increase of V2O5. The dielectric properties of NKN ceramics doped with 0.6 and 0.9 mol% V2O5 were better than that of pure NKN ceramics. In addition, annealing treatment was proved to be an effective technique for improving dielectric properties and reducing the leakage current density.
Keywords :
X-ray diffraction; annealing; crystal microstructure; current density; dielectric losses; ferroelectric Curie temperature; ferroelectric transitions; leakage currents; permittivity; piezoceramics; potassium compounds; sintering; sodium compounds; vanadium compounds; (Na0.5K0.5)NbO3:V2O5; Curie temperature; XRD analysis; annealing treatment; ceramics; dielectric constants; dielectric loss; dielectric properties; electrical properties; leakage current density; microstructure; phase structure; phase transitions; piezoelectric materials; sintering behavior; solid-state reaction; temperature 1060 C; Ceramics; Crystallization; Electric Conductivity; Heat; Materials Testing; Microspheres; Particle Size; Peroxidases;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2008.745
Filename :
4524973
Link To Document :
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