Title :
Preparation of ferroelectric NaNbO 3/thin films on MgO substrate by pulsed laser deposition
Author :
Oda, Shinya ; Saito, Takehisa ; Adachi, Hideaki ; Wada, Takahiro
Author_Institution :
Dept. of Mater. Chem., Ryukoku Univ., Otsu
fDate :
5/1/2008 12:00:00 AM
Abstract :
We successfully fabricated good quality NaNbO3 (NN) films on MgO substrate by pulsed laser deposition using a K-Ta-O (KTO) buffer layer. An SrRuO3 (SRO) lower electrode layer was deposited on a KTO buffer layer/(100)MgO substrate and then the NN film was deposited on top. X-ray diffraction showed that the SRO and NN films were epitaxially grown on (100)MgO substrate. Transmission electron microscopy showed a crystal- lographic relationship of [001]NN//[001]MgO between NN and MgO. The relative dielectric constant, epsivr, and dielectric loss, tan delta, of the film were 350 and 0.05 at 1 kHz, respectively. The polarization vs. electric field (P-E) hysteresis loop of the NN film was characteristic of ferroelectric behavior.
Keywords :
X-ray diffraction; buffer layers; dielectric hysteresis; dielectric losses; ferroelectric thin films; permittivity; pulsed laser deposition; sodium compounds; transmission electron microscopy; MgO; NaNbO3-SrRuO3-KTaO-MgO; X-ray diffraction; buffer layer; dielectric constant; dielectric loss; electrode layer; ferroelectric behavior; ferroelectric thin films; hysteresis loop; polarization; pulsed laser deposition; tan delta; transmission electron microscopy; Ceramics; Crystallization; Electric Conductivity; Lasers; Magnesium Oxide; Materials Testing; Membranes, Artificial;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2008.748