DocumentCode :
1224513
Title :
The Effects of Self-Noise on Error Voltage of the Delay-Lock Discriminator
Author :
Boyarsky, Abraham ; Fukada, Minoru
Author_Institution :
McGill University,Montreal,Que.,Canada
Volume :
18
Issue :
4
fYear :
1970
fDate :
8/1/1970 12:00:00 AM
Firstpage :
443
Lastpage :
447
Abstract :
This paper deals with the effects of the correlation self-noise on the error voltage of a radio frequency (RF) delaylock discriminator. The error voltage at the output of the envelope correlation network is determined in terms of the spectral components of the maximal-length sequence and the frequency response of the bandpass filters used in the two channels of the correlation network. The slope of the error voltage in the lock-on state, which is readily obtained from the above analysis, is a quantity of particular interest, because the mean-square tracking error is inversely proportional to the square of the slope. The problem of the mismatch in the two channels of the correlation network is also considered.
Keywords :
Band pass filters; Bandwidth; Communications technology; Correlation; Delay effects; Narrowband; Radar tracking; Radio frequency; Signal analysis; Voltage;
fLanguage :
English
Journal_Title :
Communication Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9332
Type :
jour
DOI :
10.1109/TCOM.1970.1090373
Filename :
1090373
Link To Document :
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