Title :
Diagnostic Study of Bonded, Thickness Mode Transducers by Input Impedance Measurement
Author :
Noguchi, Toyota ; Fukumoto, Akira
Keywords :
Acoustic transducers; Bandwidth; Bonding; Delay lines; Equivalent circuits; Impedance measurement; Optical devices; Piezoelectric transducers; Signal generators; Ultrasonic transducers;
Journal_Title :
Sonics and Ultrasonics, IEEE Transactions on
DOI :
10.1109/T-SU.1973.29774
