DocumentCode :
1224842
Title :
Microwave characterisation and modelling of silicon carbide power MESFETS: towards a nonlinear model
Author :
Royet, AS ; Cabon, B. ; Ouisse, T. ; Brylinsky, C. ; Noblanc, O. ; Dua, C.
Author_Institution :
UMR CNRS, Grenoble, France
Volume :
150
Issue :
2
fYear :
2003
fDate :
4/10/2003 12:00:00 AM
Firstpage :
85
Lastpage :
89
Abstract :
SiC power MESFETs are studied for applications to power amplification in the microwave domain. A small-signal model is explained. It provides the intrinsic bias-dependent parameters of the devices, such as Gm, Cgs, Cds, Cgd, and the current gain cut-off frequency fT. It is shown that fT and Gm decrease with the drain to source bias VDS, because of self-heating effects. The model also includes temperature dependence and is in good agreement with experiments. This is a first step to non-linear modelling of SiC MESFETs.
Keywords :
microwave field effect transistors; microwave power transistors; power MESFET; semiconductor device models; silicon compounds; wide band gap semiconductors; SiC; current gain cut-off frequency; microwave characteristics; nonlinear model; self-heating effect; silicon carbide power MESFET; small-signal model; temperature dependence;
fLanguage :
English
Journal_Title :
Microwaves, Antennas and Propagation, IEE Proceedings
Publisher :
iet
ISSN :
1350-2417
Type :
jour
DOI :
10.1049/ip-map:20030305
Filename :
1207330
Link To Document :
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