Characterization of a stress-applied polarization-maintaining (PM) fiber through photoelastic tomography

Author

Park, Yongwoo ; Paek, Un-Chul ; Kim, Dug Young

Author_Institution

Basic Res. Lab., Electron. & Telecommun. Res. Inst., Taejon, South Korea

Volume

21

Issue

4

fYear

2003

fDate

4/1/2003 12:00:00 AM

Firstpage

997

Lastpage

1004

Abstract

An accurate two-dimensional (2-D) axial stress profile of a polarization-maintaining (PM) fiber was determined using high-resolution photoelastic tomography. Likewise, determining all of the stress components of the fiber and the complete expression of stress-induced anisotropy was demonstrated. For the first time, we have expressed the anisotropy of a PM fiber in terms of birefringence distribution, and we have displayed the trajectories of principal axes on the cross section of the fiber. Mode coupling between the two orthogonal polarization modes due to the asymmetric stress applying parts of the PM fiber was also analyzed using an approximated coupled mode equation.

Keywords

birefringence; coupled mode analysis; optical fibre polarisation; optical fibre testing; optical tomography; photoelasticity; piezo-optical effects; accurate two-dimensional axial stress profile; approximated coupled mode equation; asymmetric stress; birefringence distribution; fiber cross section; high-resolution photoelastic tomography; mode coupling; stress components; stress-applied polarization-maintaining fiber; stress-induced anisotropy; trajectories of principal axes; two orthogonal polarization modes; Anisotropic magnetoresistance; Birefringence; Optical fiber devices; Optical fiber polarization; Optical fiber sensors; Optical fibers; Photoelasticity; Stress measurement; Tomography; Two dimensional displays;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/JLT.2003.810108

Filename

1207349