Title :
A Wide Dynamic-Range CMOS Image Sensor Using Self-Reset Technique
Author :
Park, Dongwon ; Rhee, Jehyuk ; Joo, Youngjoong
Author_Institution :
Arizona State Univ., Tempe
Abstract :
A wide dynamic-range (DR) pixel-level CMOS image sensor with self-reset technique has been fabricated using a 0.18-mum six-metal CMOS technology and tested to verify simultaneous increase of both DR and peak signal-to-noise ratio (SNR). It provides a continuous peak SNR enhancement over a strong incident light range. Maximum achievable DR is measured over 71.1 dB, and SNR keeps increasing at 7.3 dB/decade beyond conventional CMOS image sensors.
Keywords :
CMOS image sensors; CMOS technology; SNR enhancement; pixel-level CMOS image sensor; self-reset technique; signal-to-noise ratio; size 0.18 mum; wide dynamic-range CMOS image sensor; CMOS image sensors; CMOS technology; Dynamic range; Image converters; Image sensors; Photoconductivity; Photodiodes; Pixel; Signal to noise ratio; Voltage; CMOS image sensors; pixel-level A/D converter (ADC); self-reset technique; wide dynamic range (DR);
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2007.905396
