DocumentCode
1225218
Title
Solution-Processed n-Type Organic Field-Effect Transistors With High on /off Current Ratios Based on Fullerene Derivatives
Author
Tiwari, S.P. ; Namdas, E.B. ; Rao, V. Ramgopal ; Fichou, D. ; Mhaisalkar, S.G.
Author_Institution
Indian Inst. of Technol., Mumbai
Volume
28
Issue
10
fYear
2007
Firstpage
880
Lastpage
883
Abstract
Solution-processed n-type organic field-effect transistors (OFETs) based on the fullerene derivative {6}-1-(3-(2- thienylethoxycarbonyl)-propyl)-{5}-l-phenyl-[5,6]-C61 (TEPP) and phenyl-C61-butyric acid methyl ester (PCBM) in a multiring source/drain structure are reported. Devices with TEPP show high electron mobility up to 7.8 x 10-2 cm2/Vs in the saturation regime for bottom-contact OFETs with Au S/D electrodes with a solution-processed fullerene derivative. The ON/OFF ratios reported in this letter, which are in the range of 105 -106, are among the highest values reported for such devices. This mobility is always higher compared to PCBM devices prepared in identical conditions. The mobility of TEPP and PCBM increased with increasing temperatures in the range of 100-300 K with activation energy of 78 and 113 meV, respectively, which suggests that the thermally activated hopping of electrons is dominant in TEPP.
Keywords
electron mobility; field effect transistors; fullerene devices; hopping conduction; organic semiconductors; polymer blends; ON/OFF ratios; PCBM devices; TEPP; electron mobility; fullerene derivatives; multiring source/drain structure; on /off current ratios; organic field-effect transistors; phenyl-C61-butyric acid methyl ester; saturation regime; solution-processed n-type OFET; temperature 100 K to 300 K; {6}-1-(3-(2- thienylethoxycarbonyl)-propyl)-{5}-l-phenyl-[5,6]-C61; Dielectric substrates; Electrodes; Electron mobility; Fabrication; Gold; Materials science and technology; OFETs; Organic thin film transistors; Silicon; Thin film transistors; Field-effect mobility; hopping; organic field-effect transistor (OFET);
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2007.905960
Filename
4317680
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