Title :
Admittance Measurement Accuracies Required to Determine Nonlinear Behavior in Sonar Transducers
Author :
Huckabay, John M. ; Boehme, Hollis C. ; Hixson, Elmer L.
fDate :
3/1/1975 12:00:00 AM
Keywords :
Admittance measurement; Automation; Ceramics; Frequency measurement; Gain measurement; Q factor; Resonance; Resonant frequency; Sonar measurements; Transducers;
Journal_Title :
Sonics and Ultrasonics, IEEE Transactions on
DOI :
10.1109/T-SU.1975.30782
