DocumentCode :
1225572
Title :
A 3.2 Gb/s CDR Using Semi-Blind Oversampling to Achieve High Jitter Tolerance
Author :
Van Ierssel, Marcus ; Sheikholeslami, Ali ; Tamura, Hirotaka ; Walker, William W.
Author_Institution :
Univ. of Toronto, Toronto
Volume :
42
Issue :
10
fYear :
2007
Firstpage :
2224
Lastpage :
2234
Abstract :
A hybrid CDR is presented that embeds a 5 blind-oversampling CDR within a conventional phase-tracking CDR. This hybrid CDR has a jitter tolerance that is the product of the individual jitter tolerances. In this implementation, the jitter tolerance of a phase-tracking CDR alone is increased by a factor of 32 at frequencies below its loop filter´s bandwidth, while maintaining the high-frequency jitter tolerance of a 5x blind-oversampling CDR. Measured data from a 0.11 mum CMOS test chip at 2.4 Gb/s confirm a 200 UI peak-to-peak jitter tolerance for a 200 kHz jitter. The test chip operates from 1.9 Gb/s to 3.5 Gb/s with a BER less than 10-11, consuming 115 mW at 2.4 Gb/s.
Keywords :
CMOS integrated circuits; circuit testing; jitter; phase locked loops; synchronisation; CMOS test chip; bit rate 2.4 Gbit/s; bit rate 3.2 Gbit/s; blind oversampling; clock and data recovery; frequency 200 kHz; high jitter tolerance; hybrid CDR; loop filter bandwidth; peak-to-peak jitter tolerance; phase tracking; power 115 mW; size 0.11 micron; Bandwidth; Bit error rate; Clocks; Frequency locked loops; Jitter; Laboratories; Phase shifters; Semiconductor device measurement; Spread spectrum communication; Testing; Blind oversampling; clock and data recovery (CDR); jitter tolerance; oversampling; phase tracking;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2007.905233
Filename :
4317716
Link To Document :
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