DocumentCode
1225597
Title
Analysis and Simulation of Jitter Sequences for Testing Serial Data Channels
Author
Kim, Kyung Ki ; Huang, Jing ; Kim, Yong-Bin ; Lombardi, Fabrizio
Author_Institution
SUN Microsyst., Santa Clara, CA
Volume
4
Issue
2
fYear
2008
fDate
5/1/2008 12:00:00 AM
Firstpage
134
Lastpage
143
Abstract
This paper presents a novel modeling analysis of jitter as applicable to testing of serial data channels. Jitter is analyzed by considering separate and combined components. The primary goal is the generation of a signal containing a known amount of each jitter component. This signal can then be used for testing high speed serial data channels. Initially, jitter components are analyzed and modeled individually. Next, sequences for combining them are modeled, simulated and evaluated. Model simulation using Matlab is utilized to show the unique features of the components when they are combined into different injection sequences for producing the total jitter. Sequence dependency is investigated in depth and the validity of superposition of jitter components for typical values is confirmed. A good agreement between theory and simulation is verified; these results allow test engineers to have an insight into the interactions among jitter components in serial data channels.
Keywords
intersymbol interference; jitter; signal processing; high speed serial data channels; jitter sequences; sequence dependency; 1f noise; Analytical models; Data engineering; Data systems; Intersymbol interference; Mathematical model; Probability; Signal generators; Testing; Timing jitter; Duty cycle distortion; intersymbol interference; periodic jitter; random jitter; serial data systems; timing jitter;
fLanguage
English
Journal_Title
Industrial Informatics, IEEE Transactions on
Publisher
ieee
ISSN
1551-3203
Type
jour
DOI
10.1109/TII.2008.924589
Filename
4526708
Link To Document