• DocumentCode
    1225650
  • Title

    A Current-Recycling Technique for Shadow-Match-Line Sensing in Content-Addressable Memories

  • Author

    Zhang, Jian-Wei ; Ye, Yi-Zheng ; Liu, Bin-Da

  • Author_Institution
    Microelectron. Center, Harbin Inst. of Technol., Harbin
  • Volume
    16
  • Issue
    6
  • fYear
    2008
  • fDate
    6/1/2008 12:00:00 AM
  • Firstpage
    677
  • Lastpage
    682
  • Abstract
    A current-recycling technique for shadow-match-line (SML) sensing in content-addressable memories (CAMs) is presented. In order to minimize energy-overhead, a novel current-recycling voltage detector (CRVD) is devised, whose working current is reused to charge up the match-line (ML) to determine matches or mismatches. Furthermore, with this CRVD, the word circuits realize fast-disable of the charging paths in case of mismatches. Since the majority of CAM words are mismatched, a significant power is reduced with a high search speed. Pre-layout simulation results show the proposed 256-word times 144-bit ternary CAM, based on a 0.13-mum 1.2-V CMOS process, achieves 0.51 fJ/bit/search for the word circuit with less than 900-ps search time. The achievement illustrates a 74.2% energy-delay-product (EDP) reduction as compared with the speed-optimized current-saving scheme. Post-layout simulation results of the word circuits show 0.65 fJ/bit/search energy per search with 1.2-ns search time.
  • Keywords
    CMOS digital integrated circuits; content-addressable storage; integrated circuit layout; integrated memory circuits; CAM; CMOS process; CRVD; EDP; content-addressable memories; current-recycling technique; current-recycling voltage detector; energy-delay-product reduction; prelayout simulation; shadow-match-line sensing; CADCAM; CMOS process; Cams; Circuit simulation; Computer aided manufacturing; Detectors; Energy consumption; Multilevel systems; Throughput; Voltage; Content-addressable memory (CAM); current- recycling; low power; shadow-match-line (SML) scheme;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2008.2000247
  • Filename
    4526715