• DocumentCode
    1225687
  • Title

    Accelerated Modeling of Massively Coupled RLC Interconnects Using the Relative Inductance Extraction Method

  • Author

    Shakeri, Kaveh ; Meindl, James D.

  • Author_Institution
    Cypress Semicond., San Jose, CA
  • Volume
    16
  • Issue
    6
  • fYear
    2008
  • fDate
    6/1/2008 12:00:00 AM
  • Firstpage
    745
  • Lastpage
    754
  • Abstract
    A new inductance extraction method is defined to accelerate modeling of massively coupled resistance-inductance-capacitance (RLC) interconnects. The new relative inductance generates a sparse inductance matrix. Therefore, it enables modeling of large circuits with reasonable speed and accuracy. It maintains accuracy for a wide frequency range, even for the cases that there are far inductance couplings. It is demonstrated that the relative inductance matrix is equivalent to the conventional partial inductance matrix. Simulations done for a 16-bit bus with each bus line divided into 32 segments show that the simulations using the relative inductance method is 20 times faster and requires 9.5 times less memory compared to the established partial inductance method.
  • Keywords
    RLC circuits; equivalent circuits; inductance; integrated circuit interconnections; sparse matrices; RLC interconnects; equivalent circuits; relative inductance extraction method; resistance-inductance-capacitance interconnects; sparse inductance matrix; Acceleration; Capacitance; Circuit simulation; Coupling circuits; Equivalent circuits; Frequency; Inductance; Integrated circuit interconnections; Skin effect; Sparse matrices;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2008.2000365
  • Filename
    4526719