• DocumentCode
    1225858
  • Title

    Extended study of Poynting theorem and reciprocity on nonuniform FDTD meshes

  • Author

    Celuch-Marcysiak, M.

  • Author_Institution
    Inst. of Radioelectronics, Warsaw Univ. of Technol., Poland
  • Volume
    151
  • Issue
    6
  • fYear
    2004
  • Firstpage
    452
  • Lastpage
    455
  • Abstract
    The physical mechanisms behind numerical errors arising on nonuniform FDTD meshes are revealed and evaluated, focusing on the basic step-in-cell-size mesh nonuniformity and standard as well as compensated FDTD algorithms. Beginning with rigorous derivations of mathematical formulas for the numerical reflection coefficient, it is shown that wave impedance for the travelling wave and phase shift between the standing wave E- and H-fields are conserved. However, field discontinuity across the mesh discontinuity results thereupon. As a consequence the Poynting vector increases when the wave travels from fine to coarse mesh, and decreases in the opposite case. The Poynting theorem and reciprocity condition are violated. In standard FDTD, these numerical artifacts are at the level of -32 dB for the benchmarking case of ten coarse cells per wavelength and 10:1 mesh grading ratio. The compensated FDTD scheme suppresses the nonphysical effects to the level of -60 dB, which is practically undetectable in FDTD analyses of real problems.
  • Keywords
    computational electromagnetics; electromagnetic wave reflection; electromagnetic wave transmission; finite difference time-domain analysis; mesh generation; FDTD algorithms; Poynting theorem; Poynting vector; benchmarking; electromagnetic field discontinuity; mathematical formulas; mesh discontinuity; mesh grading ratio; nonphysical effects; nonuniform FDTD meshes; numerical artifacts; numerical errors; numerical reflection coefficient; phase shift; physical mechanisms; reciprocity condition; standing wave E-fields; standing wave H-fields; step-in-cell-size mesh nonuniformity; step-in-cell-size standard; travelling wave impedance;
  • fLanguage
    English
  • Journal_Title
    Science, Measurement and Technology, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2344
  • Type

    jour

  • DOI
    10.1049/ip-smt:20040721
  • Filename
    1389240