• DocumentCode
    1225894
  • Title

    A 2.2-μm-Pitch Single-Transistor Charge-Modulation Pixel in a 0.13-μm CMOS Process

  • Author

    Tournier, Arnaud ; Lu, Guo-Neng ; Roy, François ; Deschamps, Benoit

  • Author_Institution
    Front-End Technol. and Manuf. Group
  • Volume
    54
  • Issue
    10
  • fYear
    2007
  • Firstpage
    2623
  • Lastpage
    2629
  • Abstract
    This paper presents the investigation of a 2.2-mum-pitch single-transistor pixel designed in a 0.13-mum CMOS process. Based on charge-induced potential variation of the floating-body of the transistor, this single pixel device can be operated to perform photodetection, charge integration, signal readout, and reset. The main electrical characteristics of the pixel are evaluated by device modeling and simulations as well as measurements of test chips. With optimization of process and electrical parameters, testing results show a conversion factor of 47 muV/hole, a charge-handling capability of 3500 holes, a temporal noise of four holes, and a dynamic range of 40 dB.
  • Keywords
    CMOS image sensors; optimisation; transistors; CMOS process; charge integration; charge-modulation; optimization; photodetection; signal readout; single-transistor pixel; size 0.13 mum; CMOS image sensors; CMOS process; CMOS technology; Electric variables; Laboratories; Pixel; Research and development; Semiconductor device measurement; Semiconductor device modeling; Testing; CMOS image sensors; Charge modulation; pixel structure;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2007.904247
  • Filename
    4317752