• DocumentCode
    1226203
  • Title

    Electronic Properties and Junction Behavior of Polyanthranilic Acid/Metal Contacts

  • Author

    Singh, Arun Kumar ; Prakash, Rajiv ; Dwivedi, A.D.D. ; Chakrabarti, P.

  • Author_Institution
    Sch. of Mater. Sci. & Technol., Banaras Hindu Univ., Varanasi
  • Volume
    29
  • Issue
    6
  • fYear
    2008
  • fDate
    6/1/2008 12:00:00 AM
  • Firstpage
    571
  • Lastpage
    574
  • Abstract
    Polyanthranilic acid (PANA), a self-doped processible conducting polymer, was synthesized and used for the first time for fabrication of contacts with configurations of (Al, Ti, Sn metal)/PANA/indium tin oxide-coated glass. The current-voltage (I-V) characteristics were measured by using microprobe arrangements, and the diode performance parameters were extracted. The I-V characteristics of the aforementioned configuration exhibited a rectifying contact for the case of Al and Ti metal contacts but an ohmic contact for the case of Sn metal contact. The electroactivity of PANA was carried out in acidic solution, and film morphology was studied by using atomic force microscope. UV-Vis spectroscopic technique was used to obtain the optical bandgap of the polymer.
  • Keywords
    atomic force microscopy; electrical contacts; energy gap; UV-Vis spectroscopic technique; atomic force microscope; current-voltage characteristics; diode performance parameters; electroactivity; electronic properties; film morphology; junction behavior; microprobe arrangements; polyanthranilic acid-metal contacts; polymer optical bandgap; rectifying contact; self-doped processible conducting polymer; tin oxide-coated glass; Atomic force microscopy; Current measurement; Diodes; Fabrication; Glass; Indium; Ohmic contacts; Optical films; Optical polymers; Tin; Conducting polymer; Schottky contact; indium tin oxide (ITO); ohmic contact; polyanthranilic acid (PANA);
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2008.922730
  • Filename
    4526776