Title :
A robust signum-based piecewise-linaer chaotic map and its application to microcontroller-based cost-effective random-bit generator
Author :
Ketthong, Patinya ; San-Um, Wimol
Author_Institution :
Intell. Electron. Syst. Res. Lab. Fac. of Eng., Thai-Nichi Inst. of Technol., Bangkok, Thailand
Abstract :
This paper presents anew random-bit generator. The random signal source is a new signum-based piecewise-linear chaotic map, which provides not only robust chaos against parameter changes but also symmetric bifurcation for zero-thresholding for digital random-bit generation. Chaos dynamics are described in terms of equilibrium and Jacobian analysis, bifurcation diagram, Lyapunov exponent, time-and frequency domain signal, and cobweb plots. Autocorrelation, histogram, and NIST standard tests suite have been realized for statistical analysis of randomness of binary sequence, and the sufficient length of 1,000,000 bits successfully passed all NIST standard tests. Experimental results of digital random-bit sequences on have been performed using Microcontroller. The proposed random-bit generator offers a potential alternative in compact and robust random bit sequence for applications in computer information security.
Keywords :
Lyapunov methods; bifurcation; chaos generators; microcontrollers; piecewise linear techniques; statistical analysis; time-frequency analysis; Jacobian analysis; Lyapunov exponent; NIST standard test; autocorrelation standard test; bifurcation diagram; chaos dynamics; cobweb plots; computer information security; digital random-bit generation; histogram standard test; microcontroller; random-bit generator; signum-based piecewise-linear chaotic map; statistical analysis; symmetric bifurcation; time-frequency domain signal; zero thresholding; Piecewise-linaerchaotic map; Random-bit generator; Robustness; Signum function;
Conference_Titel :
Electrical Engineering Congress (iEECON), 2014 International
Conference_Location :
Chonburi
DOI :
10.1109/iEECON.2014.6925909