Accurate de-embedding technique for on-chip small-signal characterization of high-frequency optical modulator

Author

Loi, K.K. ; Sakamoto, I. ; Shao, X.F. ; Hou, H.Q. ; Liao, H.H. ; Mei, X.B. ; Cheng, A.N. ; Tu, C.W. ; Chang, W.S.C.

Author_Institution

Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA

Volume

8

Issue

3

fYear

1996

fDate

3/1/1996 12:00:00 AM

Firstpage

402

Lastpage

404

Abstract

A simple and accurate de-embedding technique has been developed for characterizing the microwave circuit behavior of noninsertable multiple quantum well waveguide modulators with on-chip two-port S-parameter measurements. The small signal equivalent circuit parameters extracted from the error corrected modulation response show an excellent agreement with both one-port microwave reflection coefficient measurement and CV data measured at 1 MHz.

Keywords

S-parameters; electro-optical modulation; equivalent circuits; optical communication equipment; semiconductor quantum wells; CV data; accurate de-embedding technique; error corrected modulation response; high-frequency optical modulator; microwave circuit behavior; noninsertable multiple quantum well waveguide modulators; on-chip small-signal characterization; on-chip two-port S-parameter measurements; one-port microwave reflection coefficient measurement; small signal equivalent circuit parameters extraction; Data mining; Equivalent circuits; Error correction; Microwave circuits; Microwave measurements; Microwave theory and techniques; Optical modulation; Optical reflection; Optical waveguides; Scattering parameters;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/68.481131

Filename

481131