DocumentCode :
1227007
Title :
A conformance tester for X.25 DTE implementations
Author :
Peng, Hanwei ; Su, David H. ; Wakid, Shukri A.
Volume :
3
Issue :
4
fYear :
1989
fDate :
7/1/1989 12:00:00 AM
Firstpage :
27
Lastpage :
30
Abstract :
The authors review briefly the testing architecture of ISO 9646, a standard for defining testing methodology and architecture for all of the ISO Open Systems Interconnection layers. They then describe the test systems of the US National Institute for Standards and Technology for both the link and packet layers, and, for vendors interfacing their data terminal equipment to DDN. They explain how conformance to the Defense Data Network (DDN) X.25 interface can be verified. They also discuss the possibility of porting the test system to other test equipment.<>
Keywords :
automatic test equipment; conformance testing; data communication equipment; electronic equipment testing; standards; DDN; Defense Data Network; ISO 9646; ISO Open Systems Interconnection layers; US National Institute for Standards and Technology; X.25 DTE; X.25 interface; conformance tester; data terminal equipment; link layer; packet layer; protocols; standard; test equipment; test systems; testing architecture; Atherosclerosis; Certification; Displays; NIST; Protocols; System testing; Test equipment;
fLanguage :
English
Journal_Title :
Network, IEEE
Publisher :
ieee
ISSN :
0890-8044
Type :
jour
DOI :
10.1109/65.34742
Filename :
34742
Link To Document :
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