DocumentCode :
1227436
Title :
Optical frequency bistability and power bistability in semiconductor lasers
Author :
Li, Linlin
Author_Institution :
Dept. of Electr. Eng., Nat. Univ. of Singapore, Singapore
Volume :
31
Issue :
2
fYear :
1995
fDate :
2/1/1995 12:00:00 AM
Firstpage :
233
Lastpage :
239
Abstract :
Optical frequency bistability and power bistability in semiconductor lasers biased from below to above threshold are presented using the unified description of semiconductor lasers with external light injection. A new method is given to calculate the bistable frequency and power loop widths. When the bias current of a laser is fixed, there is a lowest power for the external light to realize optical frequency bistability. And this lowest power reaches its minimum just at threshold. The optical injection level (defined as the ratio of the injected power to the power emitted by the free-running laser) must be larger than a certain value to obtain the bistability. This level may be larger than unity for a laser biased below threshold. On the other hand, for a given bias current, there is a lowest frequency detuning between the electric field of the laser and the injected field to achieve the power bistability. And this detuning must be negative for any bias current (below or above threshold) of the laser. The results are in good agreement with experiments
Keywords :
laser theory; optical bistability; semiconductor lasers; semiconductor switches; above threshold; below threshold; bias current; bistable frequency; electric field; external light injection; free-running laser; frequency detuning; optical frequency bistability; optical injection level; power bistability; power loop widths; semiconductor lasers; Frequency estimation; Frequency locked loops; High speed optical techniques; Nonlinear optics; Optical bistability; Optical signal processing; Power lasers; Semiconductor lasers; Semiconductor optical amplifiers; Stimulated emission;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.348050
Filename :
348050
Link To Document :
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