DocumentCode :
1227502
Title :
Polarization dependence of photo-detection in strained multiple quantum-well semiconductor lasers
Author :
Higashi, Toshio ; Ikeda, Tatsuro ; Ogita, Shoichi ; Morito, Ken ; Soda, Haruhisa
Author_Institution :
Opt. Semicond. Devices Lab., Fujitsu Labs. Ltd., Kanagawa, Japan
Volume :
31
Issue :
2
fYear :
1995
fDate :
2/1/1995 12:00:00 AM
Firstpage :
286
Lastpage :
292
Abstract :
We investigated polarization dependence of photo-detection in strained layer multiple quantum-well (SL-MQW) lasers for time compressive multiplex (TCM) application. The polarization dependence of SL-MQW lasers is larger than that of bulk lasers because of the quantum effect. To improve the polarization dependence of photo-detection, we theoretically and experimentally analyzed the effect of strain quantity on the polarization dependence, and found that large tensile strained quantum-well structure is suitable for the small polarization independence of 0.8 dB and low threshold current characteristics. Moreover, we achieved smaller polarization dependence less than 0.5 dB by applying reverse bias voltage in the photo-detection mode
Keywords :
light polarisation; photodetectors; quantum well lasers; SL-MQW lasers; photo-detection; polarization dependence; quantum effect; reverse bias; strained layer multiple quantum-well lasers; threshold current; time compressive multiplex; Laser modes; Laser theory; Optical devices; Optical feedback; Optical polarization; Optical sensors; Quantum well lasers; Semiconductor lasers; Threshold current; Transceivers;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.348057
Filename :
348057
Link To Document :
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