• DocumentCode
    1227766
  • Title

    Modeling and Analysis of High-Speed I/O Links

  • Author

    Balamurugan, Ganesh ; Casper, Bryan ; Jaussi, James E. ; Mansuri, Mozhgan ; O´Mahony, Frank ; Kennedy, Joseph

  • Author_Institution
    Microprocessor Technol. Labs., Intel Corp., Hillsboro, OR
  • Volume
    32
  • Issue
    2
  • fYear
    2009
  • fDate
    5/1/2009 12:00:00 AM
  • Firstpage
    237
  • Lastpage
    247
  • Abstract
    Improvements in signaling methods, circuits and process technology have allowed input/output (I/O) data rates to scale beyond 10 Gb/s over several legacy channels. In this regime, it is critical to accurately model and comprehend channel/circuit nonidealities in order to co-optimize the link architecture, circuits, and interconnect. Empirical and worst-case analysis methods used at lower rates are inadequate to account for several deterministic and random noise sources present in I/O links today. In this paper, we review models and methods for statistical signaling analysis of high-speed links, and also propose a new way to integrate behavioral modeling approaches with analytical methods. A computationally efficient segment-based analysis method is shown to accurately capture the effect of transmit jitter and its interaction with the channel. In addition, a new jitter interpretation approach is proposed to enable the analysis of arbitrary I/O clocking topologies. We also present some examples to illustrate the practical utility of these analysis methods in the realm of high-speed I/O design.
  • Keywords
    high-speed integrated circuits; statistical analysis; analytical methods; behavioral modeling; bit rate 10 Gbit/s; channel/circuit nonidealities; high-speed links; noise sources; statistical signaling analysis; worst-case analysis methods; High-speed I/O; I/O power optimization; link analysis tools; signaling analysis; statistical signaling analysis;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2008.2011366
  • Filename
    4811945