• DocumentCode
    1227820
  • Title

    Analysis of metallic waveguides with rectangular boundaries by using the finite-difference method and the simultaneous iteration with the Chebyshev acceleration

  • Author

    Guan, Jenn-Ming ; Su, Ching-Chuan

  • Author_Institution
    Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • Volume
    43
  • Issue
    2
  • fYear
    1995
  • fDate
    2/1/1995 12:00:00 AM
  • Firstpage
    374
  • Lastpage
    382
  • Abstract
    A numerical procedure based on the finite-difference method and simultaneous iteration of the power method in conjunction with the Chebyshev acceleration technique is utilized to analyze the metallic waveguides. Due to the efficiency of the present sparse matrix eigenproblem solver, lots of unknowns can be used in the domains of the waveguide cross-sections. Therefore, accurate cutoff wavenumbers or frequencies can be obtained by using the simple finite-difference method for the commonly used metallic waveguides such as the L-shaped, single-ridged, double-ridged, and rectangular coaxial waveguides. Some discrepancies with the numerical results in the recent literature are found and detailed discussions are provided to verify the correctness of the present results
  • Keywords
    coaxial waveguides; eigenvalues and eigenfunctions; finite difference methods; iterative methods; rectangular waveguides; waveguide theory; Chebyshev acceleration; L-shaped waveguides; cutoff wavenumbers; double-ridged waveguides; finite-difference method; iterative methods; metallic waveguides; rectangular boundaries; rectangular coaxial waveguides; single-ridged waveguides; sparse matrix eigenproblem solver; waveguide cross-sections; Acceleration; Band pass filters; Chebyshev approximation; Eigenvalues and eigenfunctions; Electromagnetic waveguides; Finite difference methods; Rectangular waveguides; Sparse matrices; TEM cells; Transmission line matrix methods;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.348098
  • Filename
    348098