Title :
LRM probe-tip calibrations using nonideal standards
Author :
Williams, Dylan F. ; Marks, Roger B.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fDate :
2/1/1995 12:00:00 AM
Abstract :
The line-reflect-match (LRM) calibration is enhanced to accommodate imperfect match standards and lossy lines typical of monolithic microwave integrated circuits. We characterize the match and line standards using an additional line standard of moderate length. The new method provides a practical means of obtaining accurate, wideband calibrations with compact standard sets. Without the enhancement, calibration errors due to imperfections in typical standards can be severe
Keywords :
MMIC; calibration; integrated circuit testing; measurement standards; microwave measurement; probes; LRM probe-tip calibrations; MMIC testing; compact standard sets; imperfect match standards; line standards; line-reflect-match calibration; lossy lines; monolithic microwave integrated circuits; nonideal standards; wideband calibrations; Bandwidth; Calibration; Electrical resistance measurement; Frequency; Impedance; Inductance; Monolithic integrated circuits; Probes; Resistors; Transmission line measurements;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
