• DocumentCode
    1228467
  • Title

    3-D Design and Analysis of Functional NEMS-gate MOSFETs and SETs

  • Author

    Pruvost, Benjamin ; Mizuta, Hiroshi ; Oda, Shunri

  • Author_Institution
    Quantum Nanoelectronics Res. Center, Tokyo Inst. of Technol.
  • Volume
    6
  • Issue
    2
  • fYear
    2007
  • fDate
    3/1/2007 12:00:00 AM
  • Firstpage
    218
  • Lastpage
    224
  • Abstract
    Nanoelectromechanical system (NEMS)-gate metal- oxide-semiconductor field effect transistor (MOSFET) and single- electron transistor (SET) structures are investigated by combining 3-D design and SPICE simulation. First, the metal gate is simulated by using a 3-D simulator, which enables to design realistic 3-D device structures, and its movement is studied for different design parameters. It is demonstrated that a low stiffness design of the structure is essential for a low-voltage actuation. Results are compared with theoretical numerical simulation and a tunable capacitor model is then embedded in a SPICE simulator and coupled either with a transistor model for MOS-NEMS or with a newly developed SET analytical model for SET-NEMS. It is shown that the use of NEMS membrane can add new functionalities to conventional MOSFET and SET, such as very abrupt switching of the current, which can break theoretical limits of MOSFET, or modulation of Coulomb oscillations governing SET characteristics
  • Keywords
    MOSFET; SPICE; capacitors; micromechanical devices; nanotechnology; semiconductor process modelling; single electron transistors; 3-D design; 3-D device structures; 3-D simulator; Coulomb oscillations; MOS-NEMS; NEMS; SETs; SPICE simulation; gate MOSFETs; gate metal-oxide-semiconductor field effect transistor; nanoelectromechanical system; numerical simulation; single-electron transistor structures; tunable capacitor model; Analytical models; Biomembranes; Capacitors; FETs; MOSFETs; Nanoelectromechanical systems; Numerical simulation; SPICE; Tunable circuits and devices; Voltage; 3-D modeling; Analytical modeling; metal-oxide-semiconductor field effect transistor (MOSFET); movable gate; nanoelectromechanical system (NEMS); single-electron transistor (SET);
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2007.891825
  • Filename
    4126519