Title :
A 4-Gb/s CMOS clock and data recovery circuit using 1/8-rate clock technique
Author :
Song, Seong-Jun ; Park, Sung Min ; Yoo, Hoi-Jun
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
fDate :
7/1/2003 12:00:00 AM
Abstract :
A 4-Gb/s clock and data recovery (CDR) circuit is realized in a 0.25-μm standard CMOS technology. The CDR circuit exploits 1/8-rate clock technique to facilitate the design of a voltage-controlled oscillator (VCO) and to eliminate the need of 1:4 demultiplexer, thereby achieving low power consumption. The VCO incorporates the ring oscillator configuration with active inductor loads, generating four half-quadrature clocks. The VCO control line comprises both a programmable 6-bit digital coarse control and a folded differential fine control through a charge-pump and a low pass filter. Duty-cycle correction of clock signals is obtained by exploiting a high common-mode rejection ratio differential amplifier at the ring oscillator output. A 1/8-rate linear phase detector accomplishes the phase error detection with no systematic phase offset and inherently performs the 1:4 demultiplexing. Test chips demonstrate the jitter of the recovered clock to be 5.2 ps rms and 47 ps pk-pk for 231-1 pseudorandom bit sequence (PRBS) input data. The phase noise is measured to be -112 dBc/Hz at 1-MHz offset. The measured bit error rate is less than 10-6 for 231-1 PRBS. The chip excluding output buffers dissipates 70 mW from a single 2.5-V supply.
Keywords :
CMOS digital integrated circuits; differential amplifiers; optical receivers; phase noise; synchronisation; timing jitter; voltage-controlled oscillators; 0.25 micron; 1/8-rate clock technique; 2.5 V; 4 Gbit/s; 6 bit; 70 mW; CDR; CMOS; active inductor loads; bit error rate; clock and data recovery circuit; common-mode rejection ratio differential amplifier; duty-cycle correction; folded differential fine control; half-quadrature clocks; jitter; linear phase detector; low pass filter; output buffers; phase noise; power consumption; pseudorandom bit sequence input data; ring oscillator configuration; voltage-controlled oscillator; Active inductors; CMOS technology; Circuits; Clocks; Digital control; Energy consumption; Phase detection; Ring oscillators; Semiconductor device measurement; Voltage-controlled oscillators;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2003.813292