Title :
Low-threshold-current 670 nm multiquantum-well laser diodes
Author :
Fujii, Hiromitsu ; Okuda, J. ; Endo, Kazuhiro ; Yoshii, Hideki ; Kishi, T. ; Makita, Hiroki ; Yamada, Hiroyoshi
Author_Institution :
ULSI Device Dev. Lab., NEC Corp., Shiga
fDate :
12/8/1994 12:00:00 AM
Abstract :
Low-threshold-current (20 mA) 670 nm multiquantum-well laser diodes (LDs) for bar-code readers (BCRs) and laser pointers have been developed. A marked reduction in power consumption (40% lower than conventional bulk LDs) and a maximum CW temperature of 110°C have been realised simultaneously. Estimated lifetimes of more than 10000 h, which is sufficient for both BCRs and laser pointers, were obtained at 5 mW, 60°C, with operating currents of less than 40 mA
Keywords :
life testing; mark scanning equipment; optical pumping; power consumption; quantum well lasers; semiconductor device testing; 10000 h; 20 mA; 40 mA; 5 mW; 60 C; 670 nm; bar-code readers; bulk LDs; laser pointers; lifetimes; low-threshold-current; maximum CW temperature; multiquantum-well laser diodes; operating currents; power consumption;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19941465
