Title :
Measurement of dielectric loss tangent of alumina at microwave frequencies and room temperature
Author :
Woode, R.A. ; Ivanov, E.N. ; Tobar, M.E. ; Blair, D.G.
Author_Institution :
Dept. of Phys., Western Australia Univ., Nedlands, WA
fDate :
12/8/1994 12:00:00 AM
Abstract :
The use of whispering gallery modes allows the dielectric loss tangent of polycrystalline Al2O3 (alumina) to be accurately determined at microwave frequencies without the use of a cavity. The dielectric loss tangent of alumina is shown to be strongly variable from sample to sample with a lowest measured value of 4.3×10-5 observed at 9.0 GHz in a 99.5% alumina sample
Keywords :
alumina; dielectric loss measurement; microwave measurement; 9 GHz; Al2O3; alumina; dielectric loss tangent measurement; microwave frequencies; polycrystalline material; room temperature; whispering gallery modes;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19941470
