• DocumentCode
    1228849
  • Title

    A PSP-Based Small-Signal MOSFET Model for Both Quasi-Static and Nonquasi-Static Operations

  • Author

    Aarts, Annemarie C T ; Smit, Geert D J ; Scholten, Andries J. ; Klaassen, Dirk B M

  • Author_Institution
    Dept. of Math. & Comput. Sci., Tech. Univ. Eindhoven, Eindhoven
  • Volume
    55
  • Issue
    6
  • fYear
    2008
  • fDate
    6/1/2008 12:00:00 AM
  • Firstpage
    1424
  • Lastpage
    1432
  • Abstract
    In this paper, a small-signal MOSFET model is described, which takes the local effects of both velocity saturation and transverse mobility reduction into account. The model is based on the PSP model and is valid for both quasi-static and nonquasi-static (NQS) operations. Recently, it has been found that, in the presence of velocity saturation, the low-frequency capacitances cannot be determined from the Ward-Dutton charge-partitioning scheme. By use of the small-signal model developed in this paper, it is demonstrated that, in the presence of velocity saturation, no terminal drain and source charges exist, from which the capacitances can be derived. The small-signal model enables the determination of the correct capacitive behavior in the presence of velocity saturation. Furthermore, it is demonstrated how the small-signal model can be used to determine the number of collocation points needed in the large-signal NQS PSP model. Finally, inclusion of the local variation of mobility reduction due to the vertical electrical fields provides insight into the approach commonly applied in compact modeling, where these fields are replaced by global ones depending on the terminal voltages only.
  • Keywords
    MOSFET; capacitance; PSP model; Ward-Dutton charge-partitioning scheme; nonquasistatic operations; small-signal MOSFET model; transverse mobility reduction; velocity saturation; Capacitance; Computer science; Delay; Doping; MOS devices; MOSFET circuits; Mathematics; Semiconductor process modeling; Voltage; Charge partitioning; MOSFET; PSP model; compact modeling; nonquasi-static (NQS); transistor modeling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2008.921197
  • Filename
    4527050