Extraction of noise current signatures using wavelets in packaged digital systems

Author

Mandrekar, Rohan ; Swaminathan, Madhavan

Author_Institution

Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA

Volume

28

Issue

1

fYear

2005

Firstpage

45

Lastpage

56

Abstract

This paper discusses a measurement-based approach for estimating the switching noise current waveform in a functioning computer system. The proposed method consists of a wavelet-based approach for denoising the measured waveform and a technique for capturing the result in an accurate and compact model. The method has been tested on simulated and measured data. The test case considered is a high-speed functioning workstation from Sun Microsystems. Using the current source developed, simultaneous switching noise in the power distribution network of the test system has been simulated with good accuracy

Keywords

digital integrated circuits; electric current measurement; electric noise measurement; integrated circuit interconnections; integrated circuit noise; network analysis; signal denoising; switching transients; waveform analysis; wavelet transforms; Sun Microsystems; functioning computer system; high-speed functioning workstation; measurement-based approach; noise current signatures; packaged digital systems; power distribution network; signal denoising; simultaneous switching noise; switching current; switching noise current waveform; waveform denoising; wavelet-based approach; Computational modeling; Current measurement; Digital systems; Noise measurement; Noise reduction; Packaging; Power system modeling; Sun; Testing; Workstations; Current signature; signal denoising; simultaneous switching noise; switching current; wavelets;

fLanguage

English

Journal_Title

Advanced Packaging, IEEE Transactions on

Publisher

ieee

ISSN

1521-3323

Type

jour

DOI

10.1109/TADVP.2004.841673

Filename

1391066