Title :
Extraction of noise current signatures using wavelets in packaged digital systems
Author :
Mandrekar, Rohan ; Swaminathan, Madhavan
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA
Abstract :
This paper discusses a measurement-based approach for estimating the switching noise current waveform in a functioning computer system. The proposed method consists of a wavelet-based approach for denoising the measured waveform and a technique for capturing the result in an accurate and compact model. The method has been tested on simulated and measured data. The test case considered is a high-speed functioning workstation from Sun Microsystems. Using the current source developed, simultaneous switching noise in the power distribution network of the test system has been simulated with good accuracy
Keywords :
digital integrated circuits; electric current measurement; electric noise measurement; integrated circuit interconnections; integrated circuit noise; network analysis; signal denoising; switching transients; waveform analysis; wavelet transforms; Sun Microsystems; functioning computer system; high-speed functioning workstation; measurement-based approach; noise current signatures; packaged digital systems; power distribution network; signal denoising; simultaneous switching noise; switching current; switching noise current waveform; waveform denoising; wavelet-based approach; Computational modeling; Current measurement; Digital systems; Noise measurement; Noise reduction; Packaging; Power system modeling; Sun; Testing; Workstations; Current signature; signal denoising; simultaneous switching noise; switching current; wavelets;
Journal_Title :
Advanced Packaging, IEEE Transactions on
DOI :
10.1109/TADVP.2004.841673
