DocumentCode
1228952
Title
A CAD methodology and tool for the characterization of wide on-chip buses
Author
Elfadel, I.M. ; Deutsch, Alina ; Kopcsay, Gerard V. ; Rubin, Barry J. ; Smith, Howard H.
Author_Institution
IBM T. J. Watson Res. Center, Yorktown Heights, NY
Volume
28
Issue
1
fYear
2005
Firstpage
63
Lastpage
70
Abstract
In this paper, we describe a CAD methodology for the full electrical characterization of high-performance, on-chip data buses. The goal of this methodology is to allow the accurate modeling and analysis of wide, on-chip data buses as early as possible in the design cycle. The modeling is based on a manufacturing (rather than design-manual) description of the back-end-of-the-line (BEOL) cross section of a given technology and on a full, yet contained, description of the power-ground mesh in which the data bus is embedded. One major aspect of the resulting electrical models is that they allow the designer to evaluate the wide bus from the three viewpoints of signal timing, crosstalk (both inductive and capacitive), and common-mode signal integrity. Another major aspect is that they take into account such important high-frequency phenomena as the dependence of the current return-path resistance on frequencies. The CAD methodology described in this paper has been extensively correlated with on-chip hardware measurements
Keywords
circuit CAD; integrated circuit manufacture; integrated circuit modelling; system buses; system-on-chip; BEOL cross section; CAD methodology; back-end-of-the-line; capacitive crosstalk; common-mode signal integrity; current return-path resistance; frequency dependence; frequency-dependent multiconductor transmission lines; full electrical characterization; high-frequency phenomena; inductive crosstalk; manufacturing description; on chip data bus modeling; on-chip data bus analysis; on-chip hardware measurement; on-chip interconnect modeling; on-chip simultaneous switching noise; power-ground mesh; signal timing; Crosstalk; Data buses; Design automation; Electric resistance; Electrical resistance measurement; Frequency; Hardware; Signal design; Timing; Virtual manufacturing; Frequency-dependent multiconductor transmission lines; on-chip buses; on-chip interconnect CAD tool and methodology; on-chip interconnect modeling; on-chip simultaneous switching noise;
fLanguage
English
Journal_Title
Advanced Packaging, IEEE Transactions on
Publisher
ieee
ISSN
1521-3323
Type
jour
DOI
10.1109/TADVP.2004.842259
Filename
1391068
Link To Document