DocumentCode
1229368
Title
A New Design Tool: The Matched Characteristic Method of Nonlinear Analysis
Author
Mark, Donald G.
Author_Institution
Advanced Electronics Group Battelle Memorial Institute
Volume
2
Issue
2
fYear
1964
fDate
4/1/1964 12:00:00 AM
Firstpage
312
Lastpage
323
Abstract
The analytical method presented here simplifies problems associated with transmitting transistor and diode characteristics from the semiconductor manufacturer to the electronic designer. This novel approach permits the base and collector characteristics of any individual transistor of a given type to be derived from the nominal characteristics of that type by use of a set of matching factors and terms that modify the nominal characteristics to suit that individual. Availability of complete characteristics allows the designer to accurately simulate the nonlinear behavior of the device in a circuit by means of a convergent iterative process.
Keywords
Aerospace electronics; Circuit simulation; Electronics industry; Manufacturing; Performance analysis; Performance evaluation; Semiconductor device manufacture; Semiconductor diodes; Testing; Transistors;
fLanguage
English
Journal_Title
Aerospace, IEEE Transactions on
Publisher
ieee
ISSN
0536-1516
Type
jour
DOI
10.1109/TA.1964.4319604
Filename
4319604
Link To Document