DocumentCode :
1229386
Title :
On correlating TEM cell and OATS emission measurements
Author :
Wilson, P.
Author_Institution :
EMC Baden, Switzerland
Volume :
37
Issue :
1
fYear :
1995
fDate :
2/1/1995 12:00:00 AM
Firstpage :
1
Lastpage :
16
Abstract :
The use of single-port broad-band TEM cells for both near-field and far-field radiated emission testing is considered. The approach is to model the radiation from the device under test (DUT) as due to an equivalent set of multipoles. Assuming the DUT is electrically small only the initial multipole moments, the electric and magnetic dipole terms, need be retained. A sequence of TEM cell measurements is then used to determine the equivalent DUT dipole moments, The dipole model then allows one to simulate DUT emissions both in free space and over a ground screen. Thus, emission measurements over an open area test site (OATS) as called for by various standards may be simulated. Such measurement schemes have previously been successfully developed for standard two port TEM cells. However, certain broad-band TEM cells are single-port devices; thus, some modification of the previous approach is required. This paper reviews the basics of the multipole model as it relates to TEM cells, details various measurement schemes appropriate to single-port TEM cells, and presents examples of measured emission data, both near field and far field, in all cases considered, the correlation between emission data measured directly over a ground screen and simulated ground screen data based on TEM cell measurements is excellent
Keywords :
antenna testing; electromagnetic compatibility; OATS emission; TEM cell; device under test; electric dipole term; far-field radiated emission testing; free space; ground screen; magnetic dipole term; model; multipole moments; near-field radiated emission testing; open area test site; single-port broad-band; Area measurement; Conductors; Frequency; Magnetic field measurement; Magnetic moments; Measurement standards; Open area test sites; Phase measurement; TEM cells; Testing;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/15.350235
Filename :
350235
Link To Document :
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