Title :
Synthetic TDR Measurements for TEM and GTEM Cell Characterization
Author :
Borsero, Michele ; Vizio, Giuseppe ; Parena, Daniela ; Teppati, Valeria
Author_Institution :
Ist. Nazionale di Ricerca Metrologica, Torino
fDate :
4/1/2007 12:00:00 AM
Abstract :
This paper describes the main features of the time-domain reflectometry (TDR) measurement technique and, in particular, the TDR analysis performed using a proper operating mode of the vector network analyzer (VNA), which is called synthetic TDR. Furthermore, some results of reflection measurement, which aim to characterize the impedance behavior of transverse electromagnetic (TEM) and gigahertz TEM cells by means of a commercial VNA in time-domain mode, are presented
Keywords :
TEM cells; network analysers; time-domain reflectometry; GTEM; cell characterization; gigahertz TEM cells; reflection coefficient; synthetic TDR measurements; time-domain reflectometry; transverse electromagnetic; vector network analyzer; Digital signal processing; Electromagnetic measurements; Electromagnetic reflection; Frequency measurement; Impedance measurement; Oscilloscopes; Performance analysis; Reflectometry; TEM cells; Time domain analysis; Gigahertz transverse electromagnetic (GTEM); VNA measurements; impedance; r eflection coefficient; time-domain reflectometry (TDR); transverse electromagnetic (TEM); vector network analyzer (VNA);
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2007.890796
