Synthetic TDR Measurements for TEM and GTEM Cell Characterization

Author

Borsero, Michele ; Vizio, Giuseppe ; Parena, Daniela ; Teppati, Valeria

Author_Institution

Ist. Nazionale di Ricerca Metrologica, Torino

Volume

56

Issue

2

fYear

2007

fDate

4/1/2007 12:00:00 AM

Firstpage

271

Lastpage

274

Abstract

This paper describes the main features of the time-domain reflectometry (TDR) measurement technique and, in particular, the TDR analysis performed using a proper operating mode of the vector network analyzer (VNA), which is called synthetic TDR. Furthermore, some results of reflection measurement, which aim to characterize the impedance behavior of transverse electromagnetic (TEM) and gigahertz TEM cells by means of a commercial VNA in time-domain mode, are presented

Keywords

TEM cells; network analysers; time-domain reflectometry; GTEM; cell characterization; gigahertz TEM cells; reflection coefficient; synthetic TDR measurements; time-domain reflectometry; transverse electromagnetic; vector network analyzer; Digital signal processing; Electromagnetic measurements; Electromagnetic reflection; Frequency measurement; Impedance measurement; Oscilloscopes; Performance analysis; Reflectometry; TEM cells; Time domain analysis; Gigahertz transverse electromagnetic (GTEM); VNA measurements; impedance; r eflection coefficient; time-domain reflectometry (TDR); transverse electromagnetic (TEM); vector network analyzer (VNA);

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2007.890796

Filename

4126837