• DocumentCode
    1229894
  • Title

    Acoustic microscopy and nonlinear effects in pressurized superfluid helium

  • Author

    Moulthrop, Andrew A. ; Muha, Michael S. ; Hadimioglu, Babur ; Silva, Christopher P. ; Kozlowski, Gregory C.

  • Author_Institution
    Aerospace Corp., Los Angeles, CA, USA
  • Volume
    39
  • Issue
    2
  • fYear
    1992
  • fDate
    3/1/1992 12:00:00 AM
  • Firstpage
    204
  • Lastpage
    211
  • Abstract
    The operation of an acoustic microscope having a resolution of 15 mm has been demonstrated. It uses as a coupling medium superfluid /sup 4/He colder than 0.9 K and pressurized to greater than 20 bar. The microscope has been used to image objects that show little or no contrast on a scanning electron microscope. In addition, the acoustic microscope has been used to study the properties of sound propagation in the coupling fluid. At low acoustic intensities, the coupling fluid has very low acoustic attenuation at the microscope´s operating frequency (15.3 GHz), but near the focal point the acoustic intensity can be high enough that the helium behaves with extreme nonlinearity. In fact, this medium is capable of entering new regimes of nonlinear interaction. Plots of the received signal versus input power display a nearly complete source depletion at certain input power levels and a reconversion to the source frequency at higher power levels. Arguments that the process underlying this nonlinear behavior is harmonic generation are presented.<>
  • Keywords
    acoustic microscopy; liquid helium sound propagation; nonlinear acoustics; superfluid helium-4; 15.3 GHz; 20 bar; acoustic attenuation; acoustic intensity; acoustic microscope; coupling fluid; harmonic generation; nonlinear effects; pressurised superfluid /sup 4/He; sound propagation; source depletion; Acoustic propagation; Acoustic waves; Attenuation; Frequency; Helium; Instruments; Lenses; Nonlinear acoustics; Scanning electron microscopy; Signal resolution;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.139116
  • Filename
    139116