• DocumentCode
    1230196
  • Title

    Isolation Techniques for Soft Cores

  • Author

    Sinanoglu, Ozgur ; Petrov, Tsvetomir

  • Author_Institution
    Dept. of Math. & Comput. Sci., Kuwait Univ., Safat
  • Volume
    27
  • Issue
    8
  • fYear
    2008
  • Firstpage
    1453
  • Lastpage
    1466
  • Abstract
    A cost effective system-on-a-chip (SOC) test strongly hinges on the parallel independent test of SOC cores, which can only be ensured through proper core isolation techniques. Whereas a core isolation mechanism can provide controllability and observability at the core I/O interface, its implementation may have various implications on area, functional timing, test time and data volume, and at-speed coverage on the core interface. In this paper, we provide an in-depth analysis of the soft core isolation problem by covering a wide spectrum of techniques ranging from the utilization of only functional registers to the utilization of only wrapper cells. We model the generalized problem of finding the minimum number of isolation registers, in the form of a mixture of functional registers and wrapper cells, by mapping the problem onto the maximum Boolean satisfiability problem; by utilizing the key findings in this mapping, we implement a computationally efficient heuristic for selecting a subset of core I/Os, on which wrapper cell insertion minimizes the total number of interface registers. Finally, we demonstrate the application of this heuristic, with area and performance constraints also accounted for, delivering a wide spectrum of tradeoff points for isolating a soft core.
  • Keywords
    Boolean functions; design for testability; integrated circuit testing; logic testing; system-on-chip; SOC testing; computationally efficient heuristic; design-for-testability; functional registers; maximum Boolean satisfiability problem; soft core isolation problem; system-on-a-chip testing; wrapper cells; Core-based testing; Modular SOC testing; core-based testing; design-for-testability; design-for-testability (DfT); modular SOC testing; soft core isolation;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2008.925794
  • Filename
    4527400