• DocumentCode
    1230205
  • Title

    The physics of the environmental sensitivity of rubidium gas cell atomic frequency standards

  • Author

    Riley, William J., Jr.

  • Author_Institution
    EG&G Frequency Products, Salem, MA, USA
  • Volume
    39
  • Issue
    2
  • fYear
    1992
  • fDate
    3/1/1992 12:00:00 AM
  • Firstpage
    232
  • Lastpage
    240
  • Abstract
    The physical mechanisms behind environmental sensitivity are considered, and they are related to the performances of rubidium frequency standards (RFSs). Some of the RFS environmental sensitivities are due to simple physical mechanisms like the effect of DC magnetic field on the Rb hyperfine resonance frequency. For these, an analysis can be based on physical principles and straightforward design factors. Other environmental factors, like temperature sensitivity, are more complex combinations of many effects, both physical and practical, and the analysis often takes the form of an error budget, with large unit-to-unit variations. Today´s RFSs span a wide performance range from small, inexpensive units with pp10/sup 10/ error budgets to larger, higher-performance versions offering pp10/sup 14/ stabilities. For both extremes, however, environmental sensitivity can be the most significant performance limitation. Why this is the case is explained, and some insight into how to make improvements is offered.<>
  • Keywords
    atomic clocks; environmental degradation; frequency measurement; measurement standards; rubidium; sensitivity; Rb frequency standards; effect of DC magnetic field; environmental sensitivity; error budget; gas cell atomic frequency standards; hyperfine resonance frequency; moisture sensitivity; performances; temperature sensitivity; Atomic clocks; Environmental factors; Frequency; Magnetic analysis; Magnetic fields; Magnetic resonance; Meeting planning; Physics; Stability; Temperature sensors;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.139119
  • Filename
    139119