Resistance-Based Scaling of Noise Temperatures From 1 kHz to 1 MHz

Author

Labenski, John R. ; Tew, W.L. ; Nam, S.W. ; Benz, Samuel P. ; Dresselhaus, Paul D. ; Burroughs, Charles J., Jr.

Author_Institution

National Inst. of Stand. & Technol., Gaithersburg, MD

Volume

56

Issue

2

fYear

2007

fDate

4/1/2007 12:00:00 AM

Firstpage

481

Lastpage

485

Abstract

A conventional technique for scaling temperatures in Johnson noise thermometry is via resistance ratios. We describe measurements from 1 kHz to 1 MHz using this approach via correlation methods in the frequency domain. We show that the effects of the mismatch in time constants of the input networks may be empirically treated to extract the noise power and temperature ratios in the low-frequency limit with uncertainties < 60 muK/K

Keywords

correlation methods; electric noise measurement; frequency-domain analysis; temperature measurement; thermal noise; 0.000001 to 1 MHz; Johnson noise thermometry; correlation methods; frequency domain; input networks; noise power; noise temperatures; resistance-based scaling; Capacitance; Correlators; Couplings; Frequency measurement; Low-frequency noise; Noise measurement; Signal to noise ratio; Temperature measurement; Thermal resistance; Voltage; Noise; noise measurement; t emperature measurement; temperature;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2007.891070

Filename

4126889