Title :
Resistance-Based Scaling of Noise Temperatures From 1 kHz to 1 MHz
Author :
Labenski, John R. ; Tew, W.L. ; Nam, S.W. ; Benz, Samuel P. ; Dresselhaus, Paul D. ; Burroughs, Charles J., Jr.
Author_Institution :
National Inst. of Stand. & Technol., Gaithersburg, MD
fDate :
4/1/2007 12:00:00 AM
Abstract :
A conventional technique for scaling temperatures in Johnson noise thermometry is via resistance ratios. We describe measurements from 1 kHz to 1 MHz using this approach via correlation methods in the frequency domain. We show that the effects of the mismatch in time constants of the input networks may be empirically treated to extract the noise power and temperature ratios in the low-frequency limit with uncertainties < 60 muK/K
Keywords :
correlation methods; electric noise measurement; frequency-domain analysis; temperature measurement; thermal noise; 0.000001 to 1 MHz; Johnson noise thermometry; correlation methods; frequency domain; input networks; noise power; noise temperatures; resistance-based scaling; Capacitance; Correlators; Couplings; Frequency measurement; Low-frequency noise; Noise measurement; Signal to noise ratio; Temperature measurement; Thermal resistance; Voltage; Noise; noise measurement; t emperature measurement; temperature;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2007.891070
