• DocumentCode
    1230323
  • Title

    Smooth local cosine based Galerkin method for scattering problems

  • Author

    Pan, George W. ; Tretiakov, Youri V. ; Gilbert, Barry

  • Author_Institution
    Telecommun. Res. Center, Arizona State Univ., Tempe, AZ, USA
  • Volume
    51
  • Issue
    6
  • fYear
    2003
  • fDate
    6/1/2003 12:00:00 AM
  • Firstpage
    1177
  • Lastpage
    1184
  • Abstract
    The smooth local trigonometric (SLT) functions are employed as the basis and testing functions in the Galerkin based method of moments (MoM), and sparse impedance matrices are obtained. The basic idea of SLT is to use smooth cutoff functions to split the function and to fold overlapping parts back into the intervals so that the orthogonality of the system is preserved. Moreover, by choosing the correct trigonometric basis, rapid convergence in the case of smooth functions is ensured. The SLT system is particularly suitable to handle electrically large scatterers, where the integral kernel behaves in a highly oscillatory manner. Numerical examples demonstrate the scattering of electromagnetic waves from two-dimensional objects with smooth contours as well as with sharp edges. A comparison of the new approach versus the traditional MoM and wavelet methods is provided.
  • Keywords
    Galerkin method; convergence of numerical methods; electromagnetic wave scattering; impedance matrix; integral equations; method of moments; sparse matrices; Galerkin method; MoM; basis functions; convergence; electrically large scatterers; electromagnetic wave scattering; integral kernel; method of moments; oscillatory manner; smooth cutoff functions; smooth local cosine; smooth local trigonometric functions; sparse impedance matrices; testing functions; two-dimensional objects; Convergence; Cutoff frequency; Discrete cosine transforms; Electromagnetic scattering; Equations; Impedance; Kernel; Moment methods; Sparse matrices; Testing;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.2003.809086
  • Filename
    1208734