• DocumentCode
    1230351
  • Title

    Cooper Pair Transport in a Resistor-Biased Josephson Junction Array

  • Author

    Lotkhov, Sergey V. ; Krupenin, Vladimir A. ; Zorin, Alexander B.

  • Author_Institution
    Phys.-Technische Bundesanstalt, Braunschweig
  • Volume
    56
  • Issue
    2
  • fYear
    2007
  • fDate
    4/1/2007 12:00:00 AM
  • Firstpage
    491
  • Lastpage
    494
  • Abstract
    The dc transport properties of long arrays of small Al Josephson junctions, biased through on-chip Cr resistors, are studied. The IV characteristics show a large Coulomb threshold for current as well as negative-slope regions indicating the regime of autonomous Bloch oscillations up to rather high frequencies of f = I/2e ~ 1 GHz, comparable to those reported by other groups for single junctions. On the other hand, a small depth of the back-bending implies a low duty cycle and a broad spectrum of the oscillations, which we attribute to the insufficiently high impedance of the bias resistors. A self-sustained switching process at a small bias current is used to study the statistics of the switching voltages and to determine the effective Bloch capacitance which was found to considerably exceed the geometric junction capacitance
  • Keywords
    Cooper pairs; aluminium; chromium; superconducting arrays; superconducting junction devices; superconducting switches; Al; Al Josephson junctions; Bloch capacitance; Cooper pair transport; Coulomb threshold; Cr; IV characteristics; autonomous Bloch oscillations; dc transport properties; geometric junction capacitance; on-chip Cr resistors; resistor-biased Josephson junction array; self-sustained switching process; Capacitance; Coupling circuits; Equations; Frequency; Josephson junctions; Quantization; Resistors; Superconducting devices; Tunneling; Voltage; Charge transfer; Josephson arrays; S QUIDs; current; stripline components; superconductor–insulator–superconductor devices; thin-film devices;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2007.890793
  • Filename
    4126891