Title :
Uncertainties of VNA S-Parameter Measurements Applying the TAN Self-Calibration Method
Author_Institution :
Phys.-Technische Bundesanstalt, Braunschweig
fDate :
4/1/2007 12:00:00 AM
Abstract :
For the seven-term general through-attenuator-network (TAN) self-calibration method of a four-sampler vector network analyzer and for all derived calibration methods such as through-line-network, through-reflect-line, through-reflect-match, through-attenuator-reflect, or through-match-network, expressions for the deviations of the measured S-parameters of two-port test objects (device under test) from their true values, which are caused by deviations of the S-parameters of nonideal calibration elements ("standards") from their ideal values, are presented. These sensitivity coefficients can be used for establishing the type-B uncertainty budget for S-parameter measurements
Keywords :
S-parameters; calibration; network analysers; TAN self-calibration method; VNA S-parameter measurements; four-sampler vector network analyzer; nonideal calibration elements; scattering parameters; sensitivity coefficients; seven-term through-attenuator-network calibration; through-attenuator-network self-calibration method; through-attenuator-reflect; through-line-network; through-match-network; through-reflect-line; through-reflect-match; Attenuators; Automatic testing; Calibration; Connectors; Contact resistance; Crosstalk; Helium; Reflection; Scattering parameters; Transmission line measurements; Scattering parameters; sensitivity coefficients; seven-term through–attenuator–network (TAN) calibration; through–reflect–line (TRL) calibration; through–reflect–match (TRM) calibration; vector network analyzer (VNA);
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2007.891051