DocumentCode :
1231040
Title :
Run by run process control: combining SPC and feedback control
Author :
Sachs, Emanuel ; Hu, Albert ; Ingolfsson, Armann
Author_Institution :
MIT, Cambridge, MA, USA
Volume :
8
Issue :
1
fYear :
1995
fDate :
2/1/1995 12:00:00 AM
Firstpage :
26
Lastpage :
43
Abstract :
The run by run controller provides a framework for controlling a process which is subject to disturbances such as shifts and drifts as a normal part of its operation. The run by run controller combines the advantages of both statistical process control (SPC) and feedback control. It has three components: rapid mode, gradual mode, and generalized SPC. Rapid mode adapts to sudden shifts in the process such as those caused by maintenance operations. Gradual mode adapts to gradual drifts in the process such as those caused by build-up of deposition inside a reactor. The choice between the two modes is determined by the outcome from generalized SPC which allows SPC to be applied to a process while it is being tuned. The run by run controller has been applied to the control of a silicon epitaxy process in a barrel reactor. Rapid mode recovered the process within 3 runs after a disturbance. Gradual mode reduced the variation of the process by a factor of 2.7 as compared to historical data
Keywords :
closed loop systems; integrated circuit manufacture; semiconductor growth; silicon; statistical process control; vapour phase epitaxial growth; IC manufacture; SPC; Si; barrel reactor; feedback control; gradual mode; maintenance operations; rapid mode; run by run process control; silicon epitaxy process; statistical process control; Control charts; Epitaxial growth; Feedback control; Inductors; Manufacturing processes; Monitoring; Output feedback; Process control; Silicon; Stochastic processes;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/66.350755
Filename :
350755
Link To Document :
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